% Encoding: windows-1252


@Article{Adams1993MTA24,
  Title                    = {Orientation imaging: The emergence of a new microscopy},
  Author                   = {Adams, Brent L. and Wright, Stuart I. and Kunze, Karsten},
  Journal                  = {Metallurgical Transactions A},
  Year                     = {1993},
  Pages                    = {819-831},
  Volume                   = {24},

  Doi                      = {10.1007/BF02656503},
  ISSN                     = {1073-5623},
  Language                 = {English},
  Owner                    = {paul},
  Publisher                = {Springer-Verlag},
  Timestamp                = {2015.09.11}
}

@Article{Alam1954PRSA221,
  Title                    = {High-angle {K}ikuchi patterns},
  Author                   = {Alam, M. N. and Blackman, M. and Pashley, D. W.},
  Journal                  = {Proceedings of the Royal Society of London A},
  Year                     = {1954},
  Pages                    = {224--242},
  Volume                   = {221},

  Doi                      = {10.1098/rspa.1954.0017},
  ISSN                     = {0080-4630},
  Owner                    = {paul},
  Publisher                = {The Royal Society},
  Timestamp                = {2015.09.11}
}

@InCollection{Day2009,
  Title                    = {Spherical {K}ikuchi Maps and Other Rarities},
  Author                   = {Day, Austin P.},
  Booktitle                = {Electron Backscatter Diffraction in Materials Science},
  Publisher                = {Springer US},
  Year                     = {2009},
  Edition                  = {2nd},
  Editor                   = {Schwartz, Adam J. and Kumar, Mukul and Adams, Brent L. and Field, David P.},
  Pages                    = {65-80},

  Doi                      = {10.1007/978-0-387-88136-2_5},
  ISBN                     = {978-0-387-88135-5},
  Language                 = {English},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Book{Goldstein2003,
  Title                    = {Scanning Electron Microscopy and X-ray Microanalysis},
  Author                   = {Joseph Goldstein and Dale E. Newbury and David C. Joy and Charles E. Lyman and Patrick Echlin and Eric Lifshin and Linda Sawyer and J.R. Michael},
  Publisher                = {Springer US},
  Year                     = {2003},
  Edition                  = {3rd},

  Booktitle                = {Scanning Electron Microscopy and X-ray Microanalysis},
  Doi                      = {10.1007/978-0-387-88136-2_1},
  ISBN                     = {978-0-387-88135-5},
  Language                 = {English},
  Owner                    = {paul},
  Pages                    = {1-20},
  Timestamp                = {2015.09.11}
}

@Article{KreigerLassen1998JM190,
  Title                    = {Automatic high-precision measurements of the location and width of {K}ikuchi bands in electron backscatter diffraction patterns},
  Author                   = {Krieger Lassen, N. C.},
  Journal                  = {Journal of Microscopy},
  Year                     = {1998},
  Pages                    = {375--391},
  Volume                   = {190},

  Doi                      = {10.1046/j.1365-2818.1998.00330.x},
  ISSN                     = {1365-2818},
  Owner                    = {paul},
  Publisher                = {Blackwell Science Ltd, UK},
  Timestamp                = {2015.09.11}
}

@Article{KriegerLassen1992SM6,
  Title                    = {Image processing procedures for analysis of electron back scattering patterns},
  Author                   = {Krieger Lassen, N.C. and Juul Jensen, D. and Conradsen, K.},
  Journal                  = {Scanning Microscopy},
  Year                     = {1992},
  Pages                    = {115--121},
  Volume                   = {6},

  ISSN                     = {0891-7035},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Llopart2002IEEETNS49,
  Title                    = {Medipix2: A 64-k pixel readout chip with 55-{$\mu$}m square elements working in single photon counting mode},
  Author                   = {Llopart, X. and Campbell, M. and Dinapoli, R. and San Segundo, D. and Pernigotti, E.},
  Journal                  = {Nuclear Science, IEEE Transactions on},
  Year                     = {2002},

  Month                    = {Oct},
  Pages                    = {2279-2283},
  Volume                   = {49},

  Doi                      = {10.1109/TNS.2002.803788},
  ISSN                     = {0018-9499},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Llopart2007NIMA581,
  Title                    = {Timepix, a 65k programmable pixel readout chip for arrival time, energy and/or photon counting measurements },
  Author                   = {X. Llopart and R. Ballabriga and M. Campbell and L. Tlustos and W. Wong},
  Journal                  = {Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment },
  Year                     = {2007},
  Note                     = {\{VCI\} 2007Proceedings of the 11th International Vienna Conference on Instrumentation },
  Pages                    = {485 - 494},
  Volume                   = {581},

  Doi                      = {http://dx.doi.org/10.1016/j.nima.2007.08.079},
  ISSN                     = {0168-9002},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Lloyd1987MinMag51,
  Title                    = {Atomic number and crystallographic contrast images with the {SEM}: a review of backscattered electron techniques},
  Author                   = {Lloyd, Geoffrey E},
  Journal                  = {Mineralogical Magazine},
  Year                     = {1987},
  Pages                    = {3-19},
  Volume                   = {51},

  Doi                      = {10.1180/minmag.1987.051.359.02},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Matsukawa1974JPD7,
  Title                    = {Measurements of the energy distribution of backscattered kilovolt electrons with a spherical retarding-field energy analyser},
  Author                   = {T Matsukawa and R Shimizu and H Hashimoto},
  Journal                  = {Journal of Physics D: Applied Physics},
  Year                     = {1974},
  Pages                    = {695},
  Volume                   = {7},

  Doi                      = {10.1088/0022-3727/7/5/306},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@InCollection{Michael2000,
  Title                    = {Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope},
  Author                   = {Michael, JosephR.},
  Booktitle                = {Electron Backscatter Diffraction in Materials Science},
  Publisher                = {Springer US},
  Year                     = {2000},
  Edition                  = {1st},
  Editor                   = {Schwartz, AdamJ. and Kumar, Mukul and Adams, BrentL.},
  Pages                    = {75-89},

  Doi                      = {10.1007/978-1-4757-3205-4_7},
  ISBN                     = {978-1-4757-3207-8},
  Language                 = {English},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Nishikawa1928PIA4,
  Title                    = {The diffraction of cathode rays by calcite},
  Author                   = {Shoji Nishikawa and Seishi Kikuchi},
  Journal                  = {Proceedings of the Imperial Academy},
  Year                     = {1928},
  Pages                    = {475-477},
  Volume                   = {4},

  Doi                      = {10.2183/pjab1912.4.475},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@InCollection{Schwarzer2009,
  Title                    = {Present State of Electron Backscatter Diffraction and Prospective Developments},
  Author                   = {Schwarzer, Robert A. and Field, David P. and Adams, Brent L. and Kumar, Mukul and Schwartz, Adam J.},
  Booktitle                = {Electron Backscatter Diffraction in Materials Science},
  Publisher                = {Springer US},
  Year                     = {2009},
  Edition                  = {2nd},
  Editor                   = {Schwartz, Adam J. and Kumar, Mukul and Adams, Brent L. and Field, David P.},
  Pages                    = {1-20},

  Doi                      = {10.1007/978-0-387-88136-2_1},
  ISBN                     = {978-0-387-88135-5},
  Language                 = {English},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Venables1973PM27,
  Title                    = {Electron back-scattering patterns---A new technique for obtaining crystallographic information in the scanning electron microscope},
  Author                   = { J. A. Venables and C. J. Harland },
  Journal                  = {Philosophical Magazine},
  Year                     = {1973},
  Pages                    = {1193-1200},
  Volume                   = {27},

  Doi                      = {10.1080/14786437308225827},
  Eprint                   = { 
 http://dx.doi.org/10.1080/14786437308225827
 
},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Venables1977PM35,
  Title                    = {Accurate microcrystallography using electron back-scattering patterns},
  Author                   = { J. A. Venables and R. Bin-jaya },
  Journal                  = {Philosophical Magazine},
  Year                     = {1977},
  Pages                    = {1317-1332},
  Volume                   = {35},

  Doi                      = {10.1080/14786437708232955},
  Eprint                   = { 
 http://dx.doi.org/10.1080/14786437708232955
 
},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Vespucci2015,
  Title                    = {Digital direct electron imaging of energy filtered electron backscatter diffraction patterns},
  Author                   = {S. Vespucci and A. Winkelmann and G. Naresh-Kumar and K. P. Mingard and D. Maneuski and P. R. Edwards and A. P. Day and V. O'Shea and C. Trager-Cowan},
  Journal                  = {Accepted (22/08/2015) for publication in Physical Review B},
  Year                     = {2015},

  Owner                    = {paul},
  Timestamp                = {2015.03.24}
}

@Article{Wells1999Scanning21,
  Title                    = {Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope},
  Author                   = {Wells, Oliver C.},
  Journal                  = {Scanning},
  Year                     = {1999},
  Pages                    = {368--371},
  Volume                   = {21},

  Doi                      = {10.1002/sca.4950210602},
  ISSN                     = {1932-8745},
  Owner                    = {paul},
  Publisher                = {Wiley Periodicals, Inc.},
  Timestamp                = {2015.09.11}
}

@InCollection{Wikelmann2009,
  Title                    = {Dynamical Simulation of Electron Backscatter Diffraction Patterns},
  Author                   = {Winkelmann, Aimo},
  Booktitle                = {Electron Backscatter Diffraction in Materials Science},
  Publisher                = {Springer US},
  Year                     = {2009},
  Edition                  = {2nd},
  Editor                   = {Schwartz, Adam J. and Kumar, Mukul and Adams, Brent L. and Field, David P.},
  Pages                    = {21-33},

  Doi                      = {10.1007/978-0-387-88136-2_2},
  ISBN                     = {978-0-387-88135-5},
  Language                 = {English},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Wilkinson2000JEM49,
  Title                    = {Advances in SEM-based diffraction studies of defects and strains in semiconductors},
  Author                   = {Wilkinson, Angus J.},
  Journal                  = {Journal of Electron Microscopy},
  Year                     = {2000},
  Pages                    = {299-310},
  Volume                   = {49},

  Eprint                   = {http://jmicro.oxfordjournals.org/content/49/2/299.full.pdf+html},
  Owner                    = {paul},
  Timestamp                = {2015.09.11},
  Url                      = {http://jmicro.oxfordjournals.org/content/49/2/299.abstract}
}

@Article{Winkelmann2007UM107,
  author =    {Aimo Winkelmann and Carol Trager-Cowan and Francis Sweeney and Austin P. Day and Peter Parbrook},
  title =     {Many-beam dynamical simulation of electron backscatter diffraction patterns},
  journal =   {Ultramicroscopy },
  year =      {2007},
  volume =    {107},
  pages =     {414-421},
  doi =       {10.1016/j.ultramic.2006.10.006},
  issn =      {0304-3991},
  owner =     {paul},
  timestamp = {2015.09.11}
}

@Article{Winkelmann2010NJP12,
  Title                    = {Electron energy loss and diffraction of backscattered electrons from silicon},
  Author                   = {Aimo Winkelmann and Koceila Aizel and Maarten Vos},
  Journal                  = {New Journal of Physics},
  Year                     = {2010},
  Pages                    = {053001},
  Volume                   = {12},

  Doi                      = {10.1088/1367-2630/12/5/053001},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Winkelmann2013MM19,
  Title                    = {Monte Carlo simulations for applications in electron backscatter diffraction},
  Author                   = {Winkelmann,A. and Salvat-Pujol,F. and Werner,W.},
  Journal                  = {Microscopy and Microanalysis},
  Year                     = {2013},

  Month                    = {8},
  Pages                    = {738--739},
  Volume                   = {19},

  Doi                      = {10.1017/S1431927613005680},
  ISSN                     = {1435-8115},
  Issue                    = {Supplement S2},
  Numpages                 = {2},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@InCollection{Wright2000,
  Title                    = {Advanced Software Capabilities for Automated {EBSD}},
  Author                   = {Wright, Stuart I. and Field, David P. and Dingley, David J.},
  Booktitle                = {Electron Backscatter Diffraction in Materials Science},
  Publisher                = {Springer US},
  Year                     = {2000},
  Edition                  = {1st},
  Editor                   = {Schwartz, AdamJ. and Kumar, Mukul and Adams, BrentL.},
  Pages                    = {141-152},

  Doi                      = {10.1007/978-1-4757-3205-4_13},
  ISBN                     = {978-1-4757-3207-8},
  Language                 = {English},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}

@Article{Yubero2008PRB77,
  Title                    = {Test of validity of the {$V$}-type approach for electron trajectories in reflection electron energy loss spectroscopy},
  Author                   = {Yubero, F. and Pauly, N. and Dubus, A. and Tougaard, S.},
  Journal                  = {Physical Review B},
  Year                     = {2008},

  Month                    = {Jun},
  Pages                    = {245405},
  Volume                   = {77},

  Doi                      = {10.1103/PhysRevB.77.245405},
  Issue                    = {24},
  Numpages                 = {11},
  Owner                    = {paul},
  Publisher                = {American Physical Society},
  Timestamp                = {2015.09.11}
}

@Article{Zaefferer2014AM75,
  Title                    = {Theory and application of electron channelling contrast imaging under controlled diffraction conditions },
  Author                   = {Stefan Zaefferer and Nahid-Nora Elhami},
  Journal                  = {Acta Materialia },
  Year                     = {2014},
  Pages                    = {20 - 50},
  Volume                   = {75},

  Doi                      = {http://dx.doi.org/10.1016/j.actamat.2014.04.018},
  ISSN                     = {1359-6454},
  Owner                    = {paul},
  Timestamp                = {2015.09.11}
}